Congratulations, Dr. -Ing. Peter Denninger!
The Institute of Micro- and Nanostructure Research (IMN) proudly announces that Mr. Peter Denninger defended his PhD on June 24, 2024. His exceptional work, titled “Development of Novel In Situ Electron Microscopy Techniques and Their Applications to Functional Thin Films,” has earned him the title Dr.-Ing. Congratulations, Dr. Denninger!
Peter Denninger began his journey at IMN as a master’s student, collaborating with Peter Schweizer and Christian Dolle on developing in situ techniques within the Scanning Electron Microscope (SEM). Following his master’s studies, he pursued a PhD, continuing his groundbreaking work in this field. During his time at IMN, Peter made significant contributions, including the development of low-energy electron diffraction techniques in the SEM. He successfully applied these techniques to study various functional thin film systems, such as 2D materials, polycrystalline metal thin films, and metal-semiconductor layer exchange phenomena.
Beyond his academic and research excellence, Peter is a warmhearted contributor to the institute, known for his collegiality and support. An enthusiastic sportsman, he has a particular passion for mountaineering, inspiring many with his adventurous spirit and dedication.
Over a year ago, Peter moved on to EMPA Thun in Switzerland, where he continues to advance instrumental development in electron microscopy for materials characterization.
The IMN team congratulates Peter on his achievements and wishes him continued success in his future endeavors.